The objective of this course is to become familiar with characterization techniques which are frequently used in Materials science including synthesis routes, X-ray diffraction (identification of phases, determination of cell parameter, structure refinement, ….), Atomic force Microscopy, Transmission Electron Microscopy, electrical measurements. An introduction and hands-on practices will give the students a basic knowledge of each technique and help them evaluating the advantages and limits of each technique.
After each session, the students will provide a report (1 report per group) presenting the approach, their hypotheses and results, putting emphasis on the limits of each technique. The final mark will be the mean value of the marks obtained on each report.
Sessions will be of 4 or 8 hours, depending on the difficulty.
- Teaching coordinator: Dezanneau Guilhem